With 20 years of experience, SENTECH has been equipping production lines for PVs with metrology tools. The analysis of thin layers and layer stacks is essential for obtaining maximum efficiency and homogeneous appearance of solar cells. SENTECH laser and spectroscopic ellipsometers are designed to meet the tough requirements of R&D, as well as quality control in the PV industry. Anti-reflective coatings, passivation layers, TCO, and absorber films can all be characterized.

 

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