Block ip Trap

k-Space Associates, Inc.

20 Jan 2012

k-Space announces their kSA BandiT PV, in-line PV process monitoring system. This new system directly measures key parameters, such as surface roughness, layer thickness, optical band gap, temperature, and other thin-film properties critical to PV device performance. Modular designs and flexible geometries allow for rapid measurement at multiple locations across either glass panel or flexible substrate processing lines to maximize yield and throughput.

As seen in: 2012 Solar Buyers Guide
Volume: January/February 2012