Inline metrology system

inline metrology systemLayTec announces the launch of their new, inline metrology system, X Link. X Link is part of the LayTec product line for the PV industry. The LayTec X Link system enables fast and accurate evaluation of the level of ethylene vinyl acetate (EVA) cross-linking directly after lamination. It can be integrated in any c-Si or thin-film based solar module production line, and offers 100% coverage for process and quality control. LayTec developed the inline device for monitoring the degree of cross-linking in EVA laminates in close cooperation with Fraunhofer USA. The method utilizes a rheological approach. It analyzes the response of the laminated EVA backsheet combination. The measured stiffness is directly correlated with the level of cross-linking. The data can also be given as “percentage gel content” equivalent. Placed directly after the laminator, the tool gives direct feedback to the lamination process for the adjustment of heating zones and exposure times.

LayTec | www.laytec.de
Booth 5672
 


As seen in: Intersolar North America 2012 Show-in-Print
Volume: July/August 2012